The Phasor XS from GE Inspection Technologies offers phased array capability within a conventional, portable ultrasonic flaw detector to drastically reduce inspection times and improve probability of detection. With its familiar operating platform and easy-to-understand, menu-driven inspection instructions, the new battery-powered instrument requires minimum operator training and brings phased array technology to routine manual inspection, such as airframe check procedures. When used in phased array mode, the instrument offers up to 128 individual channels and the operator can electronically multiplex a multi-element probe to achieve precise control over the angle of inspection, the amplitude, and the depth of focus of each individual ultrasonic beam. The inspection image is presented as a full color, sector B-scan on the unit™s high-resolution TFT screen, providing comprehensive data in real time. Any of the A-scans which make up the sector scan can be selected for separate display or for simultaneous display with the sector image to allow instant and reliable sizing. Sector images and A-scans can be stored on a removable SD card for off-line data analysis and management. For more information visit www.ge.com/inspectiontechnologies.
