Marvin Test Solutions has expanded the capabilities of its TS-900 PXI semiconductor test platform with the addition of the TS-960e system which offers PXI Express (PXIe) performance and expanded test capabilities for RF devices and SoC applications. The TS-960e builds on the integrated open-architecture of the TS-900 platform and accommodates PXIe and PXI modules - providing high-performance digital, mixed-signal, and RF test capabilities in a compact, single chassis footprint. The TS-960e platform combines 256, 125 MHz digital I/O channels with per-pin-PMU with multiple RF and analog test instruments in a single, 21-slot PXIe chassis. Available as a bench top or with an integrated manipulator, the TS-960e platform takes full advantage of the PXIe architecture to achieve a full-featured test solution for digital, mixed–signal or RF test applications. For more information regarding the TS-960e and GX5296, please visit marvintest.com.
